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home > TRiO and USP Programs > McNair > symposium > 2005 presentations > Richard Fuller

 

Richard Fuller
Chemistry

Mark Lonergan, Mentor

Surface Modifications Used to Create a Universal Approach of Modeling Diodes

In an attempt to better understand and test current theories of charge transfer across inorganic semiconductor | conjugated polymer interfaces, work in the Lonergan Lab has shown a correlation between the capacitance-voltage (C-V) and the current-voltage (I-V) characteristics of n-InP | poly (pyrrole) interfaces. Analytical expressions explaining the barrier height have been determined using a novel approach to evaluate the barrier height and model for tunable diodes. The most common anomalies are discrepancies between the interfacial potential barrier heights determined by various techniques. In the past, device behavior was not always reproducible, but I have shown that by using a thin polyamide film of ~ +3.0µm, I can consistently reproduce the past data needed to expand upon the current Moore’s Laws. Through this use of chemical surface modifications to control electron transfer at inorganic semiconductor interfaces, a general platform for testing electronic processes at these (IS) interfaces will help to re-engineer conventional microelectronic devices.


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